Miss. Musle Dipali B., and Miss. Musle Dipali B. “Modelling and Simulation of Microcode Based Built-In Self Test Technology for Multiported Memory”. Global Journals of Research in Engineering, vol. 17, no. F2, Jan. 2017, pp. 21-26, https://engineeringresearch.org/index.php/GJRE/article/view/1581.