Miss. Musle Dipali B. and Miss. Musle Dipali B. (2017) “Modelling and Simulation of Microcode based Built-In Self Test Technology for Multiported Memory”, Global Journals of Research in Engineering, 17(F2), pp. 21–26. Available at: https://engineeringresearch.org/index.php/GJRE/article/view/1581 (Accessed: 27 April 2024).