M. MASMOUDI. Robustness Evaluation Study of Power RF LDMOS Devices After Thermal Life Tests. Global Journals of Research in Engineering, [S. l.], v. 17, n. F6, p. 41–48, 2017. Disponível em: https://engineeringresearch.org/index.php/GJRE/article/view/1679. Acesso em: 30 apr. 2024.