TOWHID ADNAN CHOWDHURY. Investigation the Impact of Silicon Film Thickness on FDSOI and PDSOI MOSFET Characteristics. Global Journals of Research in Engineering, [S. l.], v. 23, n. F2, p. 1–6, 2023. DOI: 10.34257/GJREFVOL23IS2PG1. Disponível em: https://engineeringresearch.org/index.php/GJRE/article/view/101614. Acesso em: 3 jul. 2024.