@incollection{, C44FC2BD1F51F3F1F12409B7997F4E41 , author={{Miss. Musle DipaliB.} and {Miss. Musle DipaliB.} and {Bharati vidyapeeths college of engg for women pune}}, journal={{Global Journal of Researches in Engineering}}, journal={{GJRE}}2249-45960975-586110.34257/gjre, address={Cambridge, United States}, publisher={Global Journals Organisation}1722126 } @incollection{b0, , title={{A high speed AES design resistant to fault injection attacks}} , author={{ FatmakahriHassenmestiri } and { MohsenBelgacembouallegue } and { Machhout }} , journal={{Microprocessors and Microsystems journal}} , year={2016} , publisher={Elsevier} } @incollection{b1, , title={{Modeling and Simulation of Multi-Operation Microcode based Built-In Self Test for Memory Fault Detection and Repair}} , author={{ R KDr } and { Sharma Aditi } and { Sood }} , journal={{IEEE Annual Symposium on VLSI}} , year={2010} } @incollection{b2, , title={{Optimization of Microcode Built-In Self Test By Enhanced Faults Coverage for Embedded Memory}} , author={{ VinodProf } and { MohammedKapse } and { Arif }} , booktitle={{IEEE Students' Conference on Electrical, Electronics and Computer Science}} , year={2012} } @incollection{b3, , title={{Efficient Designs of Multiported Memory on FPGA}} , author={{ Bo-Cheng CharlesLai } and { IeeeMember } and { Jiun-LiangLin }} , booktitle={{ieee transactions on very large scale integration (vlsi) systems}} , year={2016} } @incollection{b4, , title={{Application specific multi-port memorycustomization in FPGAs}} , author={{ GAMalazgirt } and { HEYantir } and { AYurdakul } and { SNiar }} , booktitle={{Proc. IEEE Int.Conf. Field Program. Logic Appl. (FPL)}} IEEE Int.Conf. Field Program. Logic Appl. (FPL) , year={Sep. 2014} } @incollection{b5, , title={{Memory Test Optimizationfor Parasitic Bit LineCoupling in SRAMs}} , booktitle={{IEEE International Test Conference}} , editor={ Sandra Irobi Zaid Al-Ars SaidHamdioui } , year={2010} } @incollection{b6, , title={{Modelling and Simulation of Microcode Built-In Self test Architecture for Embedded Memories}} , author={{ NZHaron } and { SA MJunos } and { AS AAziz }} , booktitle={{Proc. of IEEE International Symposium on Communications and Information Technologies}} of IEEE International Symposium on Communications and Information Technologies , year={2007} } @incollection{b7, , title={{State-of-art and Future Trends in Testing Embedded Memories}} , author={{ SHamdioui } and { GNGaydadjiev } and { AJVan De Goor }} , booktitle={{International Workshop on Memory Technology, Design and Testing (MTDT'04)}} , year={2004} } @incollection{b8, , title={{A programmable BIST for DRAM testing and diagnosis}} , author={{ PBernardi } and { MGrosso } and { MSReorda } and { YZhang }} , booktitle={{Test Conference (ITC)}} , year={2010. 2010} } @book{b9, , title={{Efficient multiported memories for FPGAs}} , author={{ CELaforest } and { JGSteffan }} , note={inProc. 18th Annu} } @book{b10, , author={{ Acm/SigdaInt }} , title={{Symp. Field Program.Gate Arrays}} , year={2010} } @book{b11, , title={{Series FPGAs Configurable Logic Block User Guide,accessed on}} , author={{ Xilinx }} , year={May 30, 2016} } @incollection{b12, , title={{Multi-ported memories for FPGAs via XOR}} , author={{ CELaforest } and { MGLiu } and { ERapati } and { JGSteffan }} , booktitle={{Proc. 20th Annu. ACM/SIGDA Int. Symp. Field Program. Gate Arrays (FPGA)}} 20th Annu. ACM/SIGDA Int. Symp. Field Program. Gate Arrays (FPGA) , year={2012} }