Modelling and Simulation of Microcode based Built-In Self Test Technology for Multiported Memory
Keywords:
built-in-self test (MBIST), built-in-self repair (BISR), asynchronous P-MBIST, microcode MBIST multiported memory, redundancy logic array, field progr
Abstract
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How to Cite
Miss. Musle Dipali B., & Miss. Musle Dipali B. (2017). Modelling and Simulation of Microcode based Built-In Self Test Technology for Multiported Memory. Global Journals of Research in Engineering, 17(F2), 21–26. Retrieved from https://engineeringresearch.org/index.php/GJRE/article/view/1581
Published
2017-01-15
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This work is licensed under a Creative Commons Attribution 4.0 International License.